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How to cite (IEEE):
a. fdsfas
"PENENTUAN MICROSTRUCTURE LAPISAN TIPIS CdS MENGGUNAKAN X-RAY DIFFRACTOMETER," Workshop E-Journal, vol. 2, no. 4, , Dec 2012.
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How to cite (APA):
fdsfas, a.
(2012).
PENENTUAN MICROSTRUCTURE LAPISAN TIPIS CdS MENGGUNAKAN X-RAY DIFFRACTOMETER.
Workshop E-Journal, 2(4).
##plugins.citationFormats.apa.retrieved##
How to cite (Chicago):
fdsfas, ahdfasdf.
"PENENTUAN MICROSTRUCTURE LAPISAN TIPIS CdS MENGGUNAKAN X-RAY DIFFRACTOMETER" Workshop E-Journal [Online], Volume 2 Number 4 (12 December 2012)
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How to cite (Vancouver):
fdsfas a .
PENENTUAN MICROSTRUCTURE LAPISAN TIPIS CdS MENGGUNAKAN X-RAY DIFFRACTOMETER.
Workshop E-Journal [Online]. 2012 Dec;
2(4).
##plugins.citationFormats.apa.retrieved##
How to cite (Harvard):
fdsfas, a.
,2012.
PENENTUAN MICROSTRUCTURE LAPISAN TIPIS CdS MENGGUNAKAN X-RAY DIFFRACTOMETER.
Workshop E-Journal, [Online] 2(4).
##plugins.citationFormats.apa.retrieved##
How to cite (MLA8):
fdsfas, ahdfasdf.
"PENENTUAN MICROSTRUCTURE LAPISAN TIPIS CdS MENGGUNAKAN X-RAY DIFFRACTOMETER." Workshop E-Journal [Online], 2.4 (2012): ##plugins.citationFormats.mla.noPages## Web. 10 May. 2024
, ##plugins.citationFormats.apa.retrieved##
BibTex Citation Data :
@article{